Authors: |
Simon Y. W. Li
, UCLIC, University College London
simon.li@ucl.ac.uk
Christopher W. Myers
, Cognitive Science Department Rensselaer Polytechnic Institute
myersc@rpi.edu
Michael J. Schoelles
, Cognitive Science Department Rensselaer Polytechnic Institute
schoem@rpi.edu
Wayne D. Gray
, Cognitive Science Department Rensselaer Polytechnic Institute
grayw@rpi.edu
|
